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N Type , Si-Doped GaAs(Gallium Arsenide) Substrate , 3”, Dummy Grade

Categories GaAs Wafer
Brand Name: PAM-XIAMEN
Place of Origin: China
MOQ: 1-10,000pcs
Payment Terms: T/T
Supply Ability: 10,000 wafers/month
Delivery Time: 5-50 working days
Packaging Details: Packaged in a class 100 clean room environment, in single container, under a nitrogen atmosphere
product name: N Type GaAs Substrate Wafer
Wafer Diamter: 3 inch
Package: Single wafer container or cassette
Grade: Dummy Grade
Wafer Thickness: 220~450um
keyword: GaAs wafer
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N Type , Si-Doped GaAs(Gallium Arsenide) Substrate , 3”, Dummy Grade

N Type , Si-Doped GaAs(Gallium Arsenide) Substrate , 3”, Dummy Grade


PAM-XIAMEN Develops and manufactures compound semiconductor substrates-gallium arsenide crystal and wafer. We has used advanced crystal growth technology, vertical gradient freeze(VGF) and (GaAs)Gallium Arsenide wafer processing technology. The required electrical properties are obtained by adding dopants such as silicon or zinc. The result is n-type or p-type high-resistance (>10^7 ohm.cm) or low-resistance (<10 - 2 ohm.cm) semiconductors. The wafer surfaces are generally epi-ready (extremely low contamination) i.e. their quality is suitable for direct use in epitaxial processes.


(GaAs)Gallium Arsenide Wafers for LED Applications

ItemSpecifications
Conduction TypeSC/n-type
Growth MethodVGF
DopantSilicon
Wafer Diamter3, inch
Crystal Orientation(100)2°/6°/15° off (110)
OFEJ or US
Carrier Concentration

(0.4~2.5)E18/cm3


Resistivity at RT(1.5~9)E-3 Ohm.cm
Mobility

1500~3000cm2/V.sec


Etch Pit Density<5000/cm2
Laser Marking

upon request


Surface Finish

P/E or P/P


Thickness

220~450um


Epitaxy ReadyYes
PackageSingle wafer container or cassette

(GaAs)Gallium Arsenide Wafers for LD Applications


ItemSpecificationsRemarks
Conduction TypeSC/n-type
Growth MethodVGF
DopantSilicon
Wafer Diamter3, inchIngot or as-cut available
Crystal Orientation(100)2°/6°/15°off (110)Other misorientation available
OFEJ or US
Carrier Concentration(0.4~2.5)E18/cm3
Resistivity at RT(1.5~9)E-3 Ohm.cm
Mobility1500~3000 cm2/V.sec
Etch Pit Density<500/cm2
Laser Markingupon request
Surface FinishP/E or P/P
Thickness220~350um
Epitaxy ReadyYes
PackageSingle wafer container or cassette

Properties of GaAs Crystal

PropertiesGaAs
Atoms/cm34.42 x 1022
Atomic Weight144.63
Breakdown Fieldapprox. 4 x 105
Crystal StructureZincblende
Density (g/cm3)5.32
Dielectric Constant13.1
Effective Density of States in the Conduction Band, Nc (cm-3)4.7 x 1017
Effective Density of States in the Valence Band, Nv (cm-3)7.0 x 1018
Electron Affinity (V)4.07
Energy Gap at 300K (eV)1.424
Intrinsic Carrier Concentration (cm-3)1.79 x 106
Intrinsic Debye Length (microns)2250
Intrinsic Resistivity (ohm-cm)108
Lattice Constant (angstroms)5.6533
Linear Coefficient of Thermal Expansion,6.86 x 10-6
ΔL/L/ΔT (1/deg C)
Melting Point (deg C)1238
Minority Carrier Lifetime (s)approx. 10-8
Mobility (Drift)8500
(cm2/V-s)
µn, electrons
Mobility (Drift)400
(cm2/V-s)
µp, holes
Optical Phonon Energy (eV)0.035
Phonon Mean Free Path (angstroms)58
Specific Heat0.35
(J/g-deg C)
Thermal Conductivity at 300 K0.46
(W/cm-degC)
Thermal Diffusivity (cm2/sec)0.24
Vapor Pressure (Pa)100 at 1050 deg C;
1 at 900 deg C

WavelengthIndex
(µm)
2.63.3239
2.83.3204
33.3169
3.23.3149
3.43.3129
3.63.3109
3.83.3089
43.3069
4.23.3057
4.43.3045
4.63.3034
4.83.3022
53.301
5.23.3001
5.43.2991
5.63.2982
5.83.2972
63.2963
6.23.2955
6.43.2947
6.63.2939
6.83.2931
73.2923
7.23.2914
7.43.2905
7.63.2896
7.83.2887
83.2878
8.23.2868
8.43.2859
8.63.2849
8.83.284
93.283
9.23.2818
9.43.2806
9.63.2794
9.83.2782
103.277
10.23.2761
10.43.2752
10.63.2743
10.83.2734
113.2725
11.23.2713
11.43.2701
11.63.269
11.83.2678
123.2666
12.23.2651
12.43.2635
12.63.262
12.83.2604
133.2589
13.23.2573
13.43.2557
13.63.2541

What is GaAs wafer?

Gallium arsenide (GaAs) is a compound of the elements gallium and arsenic. It is a III-V direct band gap semiconductor with a zinc blende crystal structure.

GaAs wafer is an important semiconducor material. It belongs to group III-V compound semiconductor. It is a sphalerite type lattice structure with a lattice constant of 5.65x 10-10m, a melting point of 1237 ℃ and a band gap of 1.4 EV. Gallium arsenide can be made into semi insulating high resistance materials with resistivity higher than silicon and germanium by more than three orders of magnitude, which can be used to make integrated circuit substrate, infrared detector, γ photon detector, etc. Because its electron mobility is 5-6 times larger than that of silicon, it has been widely used in microwave devices and high-speed digital circuits. The semiconductor device made of GaAs has the advantages of high frequency, high temperature and low temperature, low noise and strong radiation resistance. In addition, it can also be used to make bulk effect devices.


What is the Optical properties of GaAs Wafer?

Infrared refractive index3.3
Radiative recombination coefficient7·10-10 cm3/s

Infrared refractive index

n = k1/2 = 3.255·(1 + 4.5·10-5T)
for 300 K n= 3.299

Long-wave TO phonon energy

hνTO = 33.81·(1 - 5.5·10-5 T) (meV)
for 300 K hνTO = 33.2 meV

Long-wave LO phonon energy

hνLO= 36.57·(1 - 4·10-5 T) (meV)
for 300 K hνLO = 36.1 meV


Refractive index n versus photon energy for a high-purity GaAs.(no~5·1013 cm-3).
Solid curve is deduced from two-beam reflectance measurements at 279 K. Dark circles are obtained from refraction measurements. Light circles are calculated from Kramers-Kronig analysis
Normal incidence reflectivity versus photon energy.
.
Intrinsic absorption coefficient near the intrinsic absorption edge for different temperatures.

A ground state Rydberg energy RX1= 4.2 meV

Intrinsic absorption edge at 297 K at different doping levels. n-type doping
Intrinsic absorption edge at 297 K at different doping levels. p-type doping
The absorption coefficient versus photon energy from intrinsic edge to 25 eV.
Free carrier absorption versus wavelength at different doping levels, 296 K
Conduction electron concentrations are:
1. 1.3·1017cm-3; 2. 4.9·1017cm-3; 3. 1018cm-3; 4. 5.4·1018cm-3
Free carrier absorption versus wavelength at different temperatures.
no = 4.9·1017cm-3
Temperatures are: 1. 100 K; 2. 297 K; 3. 443 K.

At 300 K

For λ~2 µm α=6·10-18 no (cm-1) (no - in cm-1)
For λ > 4µm and 1017<no<1018cm-3α ≈ 7.5·10-20no·λ3 (cm-1) (no - in cm-3, λ - µm)


Are You Looking for GaAs substrate?

PAM-XIAMEN is proud to offer indium phosphide substrate for all different kinds of projects. If you are looking for GaAs wafers, send us enquiry today to learn more about how we can work with you to get you the GaAs wafers you need for your next project. Our group team is looking forward to providing both quality products and excellent service for you!

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